The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2004

Filed:

Sep. 13, 2002
Applicant:
Inventors:

Masaru Kawazoe, Kanagawa, JP;

Mituru Oda, Kanagawa, JP;

Tomoharu Yamada, Kanagawa, JP;

Assignee:

Akashi Corporation, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/48 ;
U.S. Cl.
CPC ...
G01N 3/48 ;
Abstract

A hardness testing apparatus comprises a sample table mounting a sample thereon, a loading arm having an indentor at its free end, a loading arm operation controlling unit, an electromagnetic brake. When the same is elevated and brought into contact with the indentor, the loading arm is moved upwardly. The loading arm operation controlling unit calculates a predetermined force to be applied to the sample in response to a displacement from a reference position of the loading arm when and after the sample is brought into contact with the indentor. The loading arm is moved upwardly such that a predetermined force calculated by the loading arm operating controlling unit is applied to the sample. The electromagnetic brake controls an elevating operation of the sample table. A direction of a current supplied to the electromagnetic brake is inverted at a predetermined timing.


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