The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2004
Filed:
Apr. 28, 2000
Dean T. Lindsay, Milpitas, CA (US);
Robert D. Snyder, Palo Alto, CA (US);
Kent A. Dickey, Westford, MA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A method and apparatus are disclosed for improving the repeatability of a system during testing by ensuring that the machine state remains the same on every test. In particular, the system ensures that the polling block of a cross-bar chip is reset to the same point in the polling sequence and to the same port upon the start of every test. The system uses a global framing clock (“GFC”) as a common timing reference. Before executing test code, the system becomes idle and waits for a rising edge of the GFC. The system then sends a message across existing links from the monarch processor performing the test to a cache controller chip. The cache controller chip waits for a GFC edge and then sends a reset message to the cross-bar chip to reset the CSR polling block. The cross-bar chip receives the signal and resets the CSR polling block.