The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2004

Filed:

Apr. 13, 2001
Applicant:
Inventors:

Jingfei Ma, Waukesha, WI (US);

Guosheng Tan, Waukesha, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

Automatic coil selection is based on determining an index gauge for a corresponding k-space data line acquired for each preselected coil during a prescan. Reliance on manual coil selection and markers is eliminated by adaptively determining the coils of an MR system that produce a preferred sensitivity to a desired field-of-view (FOV). The fast scan data is used to determine those coils most sensitive to the FOV and reject coil(s) least sensitive. Using only data acquired with the most sensitive coils, SNR is increased and unwanted artifacts are reduced in the final data acquisition and image reconstruction. Through automatic and adaptive selection/deselection, the invention reduces the susceptibility to human error, and therefore results in higher quality images.


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