The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2004

Filed:

May. 07, 2002
Applicant:
Inventor:

Paul L. Guilmette, Canton Center, CT (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

A measurement interferometer ( ) having a frame structure ( ), a laser source ( ), a detector ( ), a beam splitter ( ), a reference retroreflector ( ), a reference holder ( ) and a test retroreflector ( ). The reference rertoreflector ( ) and beam splitter ( ) are disposed in fixed relation to the reference holder ( ) to constitute a splitter-holder assembly ( ). The test retroreflector ( ) and the splitter-holder assembly ( ) are movable relative to each other and both are movably mounted on the fine structure ( ). Preferably, the test retroreflector ( ) is situated between the reference holder ( ) and the beam splitter ( ). In a particular embodiment the beam splitter ( ) is connected to the reference holder ( ) by a carbon composite rod ( ), and the test retroreflector ( ) is mounted on a probe ( ) made from a carbon composite. In one embodiment, the reference retroreflector ( ) is integral with the beam splitter ( ). There may be a vibration-dampening member such as a spring ( ) between the splitter-holder assembly ( ) and the frame structure ( ).


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