The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2004
Filed:
Feb. 20, 2002
Jochen Straehle, Dettenhausen, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
A method is for three-dimensionally, optically measuring measuring objects by comparison with a reference object, where image data of the measuring object are acquired and compared to image data of the reference object, and the measuring object is directly or indirectly assessed with regard to deviations from the reference object. A quick and, at the same time, reliable assessment of the measuring object is achieved in that the measuring object and/or the reference object or a holographic recording of the measuring object and/or of the reference object are/is rotated relative to one another about at least one axis, the image data of the measuring object being acquired and the comparison being performed in various, relative rotational positions, in that an evaluation regarding a maximum agreement of the measuring object with the reference object is performed in the different comparisons, and in that the deviation is assessed in the rotational position determined by the maximum agreement.