The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2004
Filed:
Mar. 14, 2003
Applicant:
Inventor:
Michel Leblanc, Quebec, CA;
Assignee:
Exfo Electro-Optical Engineering Inc., Vanier, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract
In a method of polarization optical time-domain reflectometer (P-OTDR) for measuring a parameter of an optical transmission path, for example an optical fiber, by transmitting pulses of light into the path and measuring the state of polarization of backscattered light against distance, statistical analysis of the degree of polarization (DOP) of the backscattered signal is used to detect sections of an optical transmission path for which mode-coupling behaviour (long h) leads to high PMD. Preferably, successive DOP measurement are taken with different state of polarization, SOP, for the P-OTDR light source.