The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2004
Filed:
Jun. 07, 2002
Applicant:
Inventors:
Bharat Bhushan, Powell, OH (US);
Christopher D. Hahm, Roy, UT (US);
Assignee:
The Ohio University, Columbus, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 2/726 ; G01R 3/102 ; G11B 2/018 ;
U.S. Cl.
CPC ...
G01R 2/726 ; G01R 3/102 ; G11B 2/018 ;
Abstract
Capacitive film thickness measurement devices and measurement systems used in machines or instruments. A capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.