The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2004

Filed:

Dec. 27, 2001
Applicant:
Inventor:

Ga Won Lee, Kyungki-Do, KR;

Assignee:

Hynix Semiconductor Inc., Kyungki-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/184 ;
U.S. Cl.
CPC ...
H01L 2/184 ;
Abstract

The present invention relates to a method of manufacturing a thin film transistor in a semiconductor device. The present invention forms a single crystal silicon thin film on an interlayer insulating film on a single crystal driver transistor using a solid phase crystallization of amorphous silicon, forms a single crystal silicon thin film transistor (C—Si TFT) in the single crystal silicon thin film in order to uses it as a load transistor and uses a contact plug connecting a drain in the driver transistor and a drain in the load transistor as a SPC (solid phase crystallization) plug, in a process of depositing a silicon thin film on a single crystal transistor by a three-dimensional stack process to deposit to form a load transistor in a manufacture process of SRAM. Therefore, the present invention can improve the uniformity and reliability of the load transistor.


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