The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2004

Filed:

Aug. 20, 2002
Applicant:
Inventors:

Frank O. Armstrong, Wylie, TX (US);

Thomas R. Johnston, Lubbock, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/37 ;
U.S. Cl.
CPC ...
G01F 1/37 ;
Abstract

A device measures air flow at multiple points in an air channel. The device includes a metering plate that has multiple passages through the metering plate. The metering plate is adapted to be positioned across the air channel in an orientation that places two or more of the multiple passages at two or more respective locations within the air channel. The metering plate is also adapted to receive two or more flow meters at the two or more passages, respectively. In addition, the metering plate is configured so that respective air flow velocities at the two or more locations when the metering plate is positioned across the air channel substantially matches air flow velocities at the two or more locations when the metering plate is not positioned across the air channel. An example embodiment includes holders such as sockets that keep the flow meters fixed in the metering plate with regard to pitch and roll.


Find Patent Forward Citations

Armstrong, Frank. (2004). System and method for measuring air flow at multiple points of an air channel (U.S. Patent No. 6722210). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6722210

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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