The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2004

Filed:

Apr. 05, 2002
Applicant:
Inventor:

Hiroyuki Morinaga, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A coordinate transformation system includes: a layout display unit configured to obtain an arbitrary point in layout data of a semiconductor device as a coordinate value of an FBM physical coordinate system indicative of a physical position; a pattern defining unit configured to define the relationship between an FBM physical address and the FBM physical coordinates using a pattern tree obtained by combining an array pattern, defining lining direction, interval, and the number of components to be disposed at equal intervals, with a random pattern, defining the relationship between the FBM physical address as a coordinate system of FBM data indicative of an electric failure position obtained by a test process of the semiconductor device and the FBM physical coordinates in a one-to-one corresponding manner; and a program generating unit configured to generate a program to transform the FBM physical address into the FBM physical coordinates from the pattern defined.


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