The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2004

Filed:

Jul. 02, 1999
Applicant:
Inventors:

Hajime Kita, Shizuoka, JP;

Takaaki Mizutani, Shizuoka, JP;

Masashi Yamaguchi, Shizuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F02D 4/114 ; G06N 3/12 ;
U.S. Cl.
CPC ...
F02D 4/114 ; G06N 3/12 ;
Abstract

A technique for estimating the best children (i.e. the next generation of individual chromosomes) for use by an online genetic analyzer (GA) is described. One embodiment provides a method for evaluation of a GA in a control system for controlling a plant. Individuals are evaluated using data for evaluation. The data for evaluation is categorized into subdomains of a larger evaluating domain. Data for evaluation is sorted into an evaluation domain wherein an evaluation value of each individual is replaced by a model of coefficients relative to a standard model. The standard model is used to calculate an evaluation value. The evaluation value can include a mean value and/or a distribution. Moreover, the mean value and distribution can be valid for an area including a periphery of the subdomain. The evaluation value can be calculated as a model obtained by using a least-squares method to find coefficients relative to coefficients of the standard model.


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