The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2004

Filed:

Sep. 16, 2002
Applicant:
Inventors:

Tatsuya Inagaki, Aichi-ken, JP;

Toshihiro Yonezu, Aichi-ken, JP;

Satoshi Abeta, Aichi-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 4/910 ; G05B 1/925 ;
U.S. Cl.
CPC ...
B24B 4/910 ; G05B 1/925 ;
Abstract

A profile data compensating method comprises a step of generating effective profile data by operating a machine tool under a non-load condition in accordance with theoretical profile data, a step of generating first error profile data representing error components of a control system, a step of generating first compensated profile data based upon the first error profile data, a step of generating measured profile data by measuring the shape of the workpiece machined in accordance with the first compensated profile data, a step of generating second error profile data representing error components of a mechanical system, and a step of generating second compensated profile data based upon the first and second error profile data.


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