The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2004
Filed:
Mar. 08, 2001
Jaroslav Vecer, Praha, CZ;
Petr Herman, Baltimore, MD (US);
Microcosm Inc., Columbia, MD (US);
Abstract
The method uses a physical phenomenon of dispersion of the optical rotation for identification of the spectral characteristics of light Polychromatic linearly polarized radiation passes through the environment that rotates a polarization plane of its spectral components, depending on their wavelength. After a subsequent passage through the analyzing polarizer, a dependence of the light intensity S(&phgr;) on the angle &phgr;, that the analyzing polarizer forms with the polarization plane of the analyzed light, is measured. S(&phgr;) is in a mathematical relationship with the spectrum of the analyzed radiation I(&lgr;), where &lgr; is a wavelength. S(&phgr;) allows for the determination of the spectral characteristics of the analyzed radiation. In devices based on the above principle, the collimated polarized beam of the analyzed radiation passes first through the optical element that exhibits a dispersion of the optical rotation, i.e. rotator ( ), then through the analyzing polarizer ( ), and after a projection is detected by a proper detector ( ). The detector measures S(&phgr;) as a function of the angle &phgr; of the analyzer. From S(&phgr;) the parameters of the spectrum I(&lgr;) are determined.