The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2004
Filed:
Nov. 19, 2002
Applicant:
Inventors:
Takuya Matsumoto, Hyogo, JP;
Kazuyuki Yagi, Hyogo, JP;
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 1/12 ;
U.S. Cl.
CPC ...
H03M 1/12 ;
Abstract
A sampling apparatus including two or more samplers, where a signal is sampled simultaneously by each sampler and the values sampled by one of the samplers is then used. In this way, sampling operations for the purpose of ranging are eliminated, and the time required for ranging can be shortened. Moreover, the possibility that the instantaneous values of the signal input to the sampler will exceed the input range of the sampler can be inferred in each sampler by establishing a suitable threshold value for its sample values.