The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2004
Filed:
Aug. 05, 2002
Applicant:
Inventors:
David D. Colby, Anna, TX (US);
Dale A. Heaton, Plano, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G01R 3/126 ;
Abstract
The present invention provides a system and method for high resolution current measurements of an integrated circuit ( ). With the present invention, no DFT circuits are required. Leakage current characterizing an integrated circuit is determined for at least one logic state of the integrated circuit from a sum of a first and second current measurement. A voltage source ( ) and a current source ( ) are used at different settings for each measurement and the measurements are summed for evaluation with an expected value.