The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2004

Filed:

Sep. 14, 2001
Applicant:
Inventors:

Milind Rajadhyaksha, Charlestown, MA (US);

James M. Zavislan, Pittsford, NY (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 4/014 ;
U.S. Cl.
CPC ...
H01J 4/014 ;
Abstract

A confocal scanning microscope system ( ) using cross polarization effects and an enhancement agent (acetic acid) to enhance confocal microscope reflectance images of the nuclei of BCCs (basal cell carcinomas) and SCCs (squamous call carcinomas) in the confocal reflectance images of excised tumor slices. The confocal scanning microscope system having a laser ( ) for generating an illumination beam ( ), a polygon mirror ( ) for scanning the beam to a tissue sample ( ) and for receiving a return beam from the tissue sample and detector ( ) for detecting the returned beam to form an image. The system further includes a half-waveplate ( ) having a rotatable stage ( ) and a quarter-wave plate ( ) having a rotatable stage ( ) disposed in the optical path of the illumination beam and at least a linear polarizer ( ) having a rotatable stage ( ) disposed in the optical path of the returned beam from the tissue sample.


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