The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2004
Filed:
Feb. 14, 2002
Applicant:
Inventors:
Stephen James Trull, Wickwar, GB;
Geoff McFarland, Dursley, GB;
Andrew Daniel Huber, Bartlett, IL (US);
Peter George Lloyd, Bristol, GB;
Assignee:
Renishaw PLC, Gloucestershire, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 ;
U.S. Cl.
CPC ...
G01B 5/008 ;
Abstract
A measurement probe ( ) is disclosed having strain sensing elements ( ) mounted on spokes ( ) of a strain sensing member ( ). The member ( ) is disposed in parallel and spaced from a diaphragm ( ). Inner portions of the member and diaphragm are connected to a stylus holder ( ) and outer portions of the member and diaphragm are connected to probe body ( ). The probe can be used to produce a signal when contact force on the stylus ( ) is within an adjustable upper and lower limit, and is thereby suited to use with a manually manipulatable coordinate measuring device.