The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2004
Filed:
Jul. 05, 2001
David J. Hathaway, Underhill Center, VT (US);
Jeffrey P. Soreff, Poughkeepsie, NY (US);
Neil R. Vanderschaaf, Round Rock, TX (US);
James D. Warnock, Somers, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for analyzing a gated clock design in which a disabling clock gating transition prevents an output transition from occurring, assuring that no clock glitching occurs. Delays and slews are computed so that the arrival time computation that includes clock and gate signal delays are computed at the output, providing tests which ensure that no glitch situation occurs. The delays and slews are computed using a static timing analysis, which includes situations such as a late and early arriving gate clock signals. The invention may be used in any static timing analysis test to ensure that a first transition on one input of a circuit prevents the propagation of a second transition on another input of the circuit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile