The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2004

Filed:

Jun. 04, 2001
Applicant:
Inventors:

Robert R. Imark, Fort Collins, CO (US);

Daniel A. Berkram, Fort Collins, CO (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
Abstract

The invention includes a method of and an apparatus for testing an integrated circuit which includes simulating the integrated circuit and generating an input vector to and expected output from the integrated circuit. This input vector and expected output are generated by entering test vectors into the circuit simulator and the integrated circuit is tested using the input vector to yield a first resulting output. A test hardware vector is also created to capture state information pertaining to the integrated circuit. The test hardware vector and the input vector are combined to create a joint input vector and debugging is performed on the integrated circuit by modifying the joint input vector and evaluating the resulting output.


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