The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2004

Filed:

Oct. 25, 1999
Applicant:
Inventor:

Thomas George Wakeman, Cincinnati, OH (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/710 ;
U.S. Cl.
CPC ...
G06F 1/710 ;
Abstract

An exemplary embodiment of the invention is directed to a method for determining a transfer function relating a critical to quality parameter to key parameters in a design for six sigma process. The method includes determining a dimensionless group containing a plurality of key parameters. The key parameters may include key control parameters or key noise parameters that have an affect on the critical to quality parameter. A transfer function relating the dimensionless group to the critical to quality parameter is then generated.


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