The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2004
Filed:
Jun. 02, 2000
Paul Dutta-Choudhury, Frankilin, MA (US);
Joe Scola, Medfield, MA (US);
Brad Safford, Framingham, MA (US);
Igor Reyzin, Needham, MA (US);
Cognex Corporation, Natick, MA (US);
Abstract
A machine vision inspection system and method that increase the resolution of object image-data without physically manipulating the physical optics of cameras used during inspection. The exemplary embodiment of the invention provides a system and method that perform what may be characterized as a digital zoom. Using this digital zoom, the resolution of object image-data provided by a camera may be artificially increased. Moreover, in accordance with the exemplary embodiment of the invention, a determination may be made regarding whether portions of the object image-data are under-resolved, and based on that determination, a local digital zoom may be performed on that under-resolved portion of object image-data to increase the resolution of that portion of object image-data. Additionally, the resulting portion of the object image-data with increased image resolution may be scaled-back, such that the portion of increased resolution object image-data may be combined with the other object image-data to provide a faithful, scaled representation of the original sample-object and/or sample-object feature.