The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2004

Filed:

Jun. 06, 2000
Applicant:
Inventor:

Wen-Lung Hsu, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/700 ; H04B 3/46 ; H04Q 1/20 ;
U.S. Cl.
CPC ...
H04B 1/700 ; H04B 3/46 ; H04Q 1/20 ;
Abstract

A method of analyzing a sample waveform in the time domain. Firstly, a periodic wave, such as a sinusoidal wave, is inputted into a waveform processing module for obtaining a sample waveform. Next, a detection of a number of peaks of the sample waveform is performed. A determination is then made as to whether the period of the sample waveform is obtainable from the peaks of the sample waveform. If not obtainable, it indicates the waveform processing module is malfunctioning. If obtainable, a determination is then made as to whether the period of the sample waveform is equal to the predicted period. According to this determination, it indicates whether the waveform processing module is functioning.


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