The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2004

Filed:

Jun. 26, 2002
Applicant:
Inventors:

Henry A. Om'Mani, Albuquerque, NM (US);

Thomas J. Davies, Jr., Albuquerque, NM (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 1/606 ;
U.S. Cl.
CPC ...
G11C 1/606 ;
Abstract

Described are circuits and methods for automatically measuring the program threshold voltage V and the erase threshold voltage V of EEPROM cells. The measured threshold voltages are employed to measure tunnel-oxide thickness and to determine optimal program and erase voltage levels for EEPROM circuits. One embodiment automatically sets the program and erase voltages based on the measured threshold voltages.


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