The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2004
Filed:
Jun. 04, 2003
Klaus-Peter Zimmer, Heerbrugg, CH;
Ruedi Rottermann, Berneck, CH;
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Abstract
The invention relates to an objective ( ) for stereomicroscopes of the telescope type which comprises three optical assemblies (G G G ), the first assembly (G ) being arranged towards the object side and the third assembly (G ) being arranged towards a magnification changer ( L, R). The proposed objective ( ) meets the conditions 0.44≦ENP/F≦0.6, where ENP denotes the diameter of the entry pupil of the magnification changer ( L, R) at the maximum magnification and F denotes the focal length of the objective ( ), and tan(w )≧0.16, where w denotes the maximum field angle of the objective ( ) at the lowest magnification of the magnification changer ( L, R). The proposed objective ( ) makes it possible to use a stereomicroscope with maximum resolution and a field of vision which is adapted to the full range of magnifications of the microscope.