The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2004
Filed:
Nov. 04, 2002
Ingo Boehm, Heidelberg, DE;
Frank Schreiber, Dossenheim, DE;
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Abstract
A method for generating a multicolor image of a specimen with a microscope is disclosed. The method comprises the step of determining the spacing of the focal planes of a first illuminating light beam that has a first wavelength and of a second illuminating light beam that has a second wavelength; the step of scanning the specimen with the first illuminating light beam and generating a first partial image; the step of performing a relative displacement, by an amount equal to the spacing, between the specimen and the focal plane of the illuminating light beam of the second wavelength; the step of scanning the specimen with the second illuminating light beam and generating a second partial image; and the step of superimposing the first and second partial images to yield the multicolor image. Further more a microscope and a confocal scanning microscope are disclosed.