The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2004
Filed:
Mar. 08, 2002
Robert C. Atkinson, Buffalo, NY (US);
Thomas E. Ryan, Batavia, NY (US);
Keshav Sharma, Lancaster, NY (US);
Michael J. Byrne, East Aurora, NY (US);
Reichert, Inc., Depew, NY (US);
Abstract
An optical configuration for differential refractive index measurements of a test sample relative to a reference sample comprises an optical path along which an illumination beam travels to simultaneously illuminate a pair of optical interfaces on opposite sides of a meridional plane corresponding to the test sample and reference sample, respectively. Partial beams leaving the optical interfaces are optically diverged to illuminate different segments of a linear scanned array aligned in the meridional plane. The difference in location of a pair of shadowlines or a pair of resonance minimums formed by the partial beams on the array provides an indication of the refractive index difference.