Electrode and fixture for measuring electronic components

Abstract

A platform for testing electronic parts and electrode used in the same for easy and accurate testing of a three-terminal device. The platform for testing electronic parts of the present invention comprises pressing means, DUT guide means, and electrode board. The pressing means presses DUT to the electrode board and maintains electrical and mechanical contact between the DUT terminals and the electrode groups. The DUT guide means hold the DUT while moving so that the relative position of the DUT to the electrode board is changed and the DUT moves between a plurality of specific positions. The electrode board has multiple electrode groups arranged corresponding to terminals of the DUT. The DUT is connected to test circuits corresponding to each of these electrode groups so that terminals of the DUT are connected to the corresponding test circuit when the DUT is placed at multiple specific positions on the above-mentioned electrode board. By means of this structure, the inductance error component of the electrodes can be extensively removed, while facilitating switching between testings of each element of a three-terminal device. Furthermore, by making the surface region of each electrode that can contact DUT a curved surface, such as a cylindrical shape or spherical shape, slight elastic deformation will occur at the region that contacts the DUT. As a result, strong surface pressure can be obtained with a relatively small load and contact resistance is stabilized.