The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2004
Filed:
Aug. 30, 2001
Applicant:
Inventors:
Koichi Mukasa, Sapporo, JP;
Kazuhisa Sueoka, Sapporo, JP;
Michiya Kimura, Ebetsu, JP;
Makoto Sawamura, Sapporo, JP;
Hirotaka Hosoi, Sapporo, JP;
Assignee:
Hokkaido University, Sapporo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/309 ;
U.S. Cl.
CPC ...
G01R 3/309 ;
Abstract
A probe for measuring a leakage magnetic field includes a substrate, a flexible cantilever having one end fixed to the substrate and a free end, and at least one magneto resistive element arranged on the free end of the cantilever. The magneto resistive element has a width within a range from 10 nm to 1 &mgr;m as measured in a direction perpendicular to a longitudinal direction of the cantilever and in a direction in which the cantilever can be deflected.