The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2004

Filed:

Nov. 02, 2001
Applicant:
Inventors:

Richard Donald Gunn, Seascale, GB;

Thomas Dockray, Seascale, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/18 ;
U.S. Cl.
CPC ...
G01T 1/18 ;
Abstract

Ions produced by radioactive gases present in air impact on the sensitivity of contamination measuring instruments which detect ions generated by radioactive materials present on an item. Methods and apparatus address this issue by conducting a measurement of ions generated in a chamber by gaseous emitters and other background events in a volume of medium and deducting this from a measurement of ions generated in another chamber by the item as well as the gaseous emitters and background events. The variation of the gaseous emitters present within the medium is addressed by moving the medium about. An alternative solution uses a medium free of gaseous emitters having a significant level, for instance by sealed storage of air prior to its use in a method and instrument.


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