The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2004
Filed:
Mar. 07, 2000
Applicant:
Inventors:
Eric Henderson, Ames, IA (US);
Michael P. Lynch, Ames, IA (US);
Assignee:
BioForce Nanosciences, Inc., Ames, IA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; G01N 1/30 ; G01N 3/3543 ; G02B 2/100 ; G02B 2/126 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; G01N 1/30 ; G01N 3/3543 ; G02B 2/100 ; G02B 2/126 ;
Abstract
The invention is a solid state process for analyzing genomes by visualizing sequence specific markers (e.g., proteins that bind a defined DNA sequence elements) by scanning probe microscopy. The method includes linear display of the nucleic acid on a solid surface, image acquisition by the scanning probe microscope, and digital data analysis. The acts of the method result in a bar code type display of each fragment of the DNA sample. These bar codes are then used to place the fragments in the order they appear on the original DNA sample.