The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2004
Filed:
Sep. 18, 2001
Applicant:
Inventors:
Jason H. Hafner, Houston, TX (US);
Chin Li Cheung, Cambridge, MA (US);
Charles M. Lieber, Lexington, MA (US);
Assignee:
President and Fellows of the Harvard College, Cambridge, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
D01F 9/12 ;
U.S. Cl.
CPC ...
D01F 9/12 ;
Abstract
A method of fabricating SWNT probes for use in atomic force microscopy is disclosed. In one embodiment, the SWNT's are fabricated using a metallic salt solution. In another embodiment, the SWNT's are fabricated using metallic colloids.
Quick Actions:
Hafner, Jason. (2004). Fabrication of nanotube microscopy tips (U.S. Patent No. 6716409). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6716409
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