The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2004
Filed:
Sep. 30, 2002
Vasyl Molebny, 03028 Kiev, UA;
Other;
Abstract
Measurement of wave abberations of eye is performed by probing the eye with a narrow beam of laser radiation and measuring the wave front tilts in subapertures of radiation, exiting back from the eye, by of a Hartman-Shack sensor. In the process of measurements, dosed tilts are introduced into the wave, repeated several times with varied tilts of the beam as a whole during each subsequent measurement, and the reconstruction of the wave front is performed in accordance with the data obtained in all angular positions of the beam. The device for measurement includes a probing channel, a measuring channel and a channel of positioning. For controlling the wave front, a unit of dosed tilting of the wave front is introduced, based on the acousto-optic deflector, in the first embodiment—in the measuring channel, and in the second embodiment—in the probing channel. A wider dynamic range of measured wave aberrations of the human eye is achieved.