The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2004
Filed:
Sep. 01, 1999
Peter Kapetanic, Morgan Hill, CA (US);
Jon Martens, San Jose, CA (US);
David Rangel, San Jose, CA (US);
Anritsu Company, Morgan Hill, CA (US);
Abstract
An instrument is provided for measuring a noise figure with significant flexibility. The instrument includes a noise source ( ) and a vector network analyzer (VNA) ( ). The VNA ( ) includes an external connector port ( ) for removable connection of the noise source ( ). The noise source ( ) can be connected to the VNA backplane port ( ), or directly to a DUT ( ). The DUT ( ) can be connected to both VNA test ports ( ) if the noise source ( ) is connected to port ( ), or only to test port ( ) if the noise source ( ) is directly connected to the DUT. A receiver connected to the test port ( ) includes a downconverter ( ) providing an IF signal through either a narrowband IF channel ( ) or a wideband IF channel ( ) for providing both wideband and narrowband power measurements enabling fast accurate measurement of a noise figure.