The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2004
Filed:
Feb. 15, 2002
Frederick D. Busche, Highland Village, TX (US);
William D. Calkins, Dallas, TX (US);
Jeffrey D. Kish, Nazareth, PA (US);
Scott L. Swain, Novi, MI (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An enhanced concern indicator failure prediction system is provided to predict possible product failures with automatic notification of people as well as systems. The system integrates data mining, spatial analysis, linear programming, narrowcasting, data warehousing, visualization, and text mining. As a result, failure conditions, attributes, complaints, locations, consequences, and sequence of events are analyzed using data mining technologies. This data is fed into an optimization module that assesses the efficiency of the failure process such that failures can be assessed as to their priority. These priorities are then used to feed a triggering engine that triggers notification of systems and individuals using narrowcasting technology. This system is one that allows early warning of potential problems to occur and integrates data from call centers, legacy systems, retailers, manufacturers, vendor supplied parts, and transportation of parts.