The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2004
Filed:
Nov. 09, 1999
Arthur Steven Bornowski, Sunnyvale, TX (US);
Lockheed Martin Corp., Bethesda, MD (US);
Abstract
A method for determining the reference plane in multi-dimensional data is disclosed. In one embodiment, the method includes (a) providing multi-dimensional imagery data, referred to as set A, including an array of pixels having object pixels marked; (b) range gating about at least a subset of the marked object pixels, including marking pixels outside the range gate to form an unmarked pixel subset of set A, referred to as subset B; (c) performing maximal z density analysis on subset B, including marking pixels outside the maximum density to form an unmarked pixel subset of subset B, referred to as subset C; (d) performing a local normal vector estimate on subset C, including marking pixels having a normal vector exceeding specified threshold L from nominal to form an unmarked pixel subset of subset C, referred to as subset D; (e) performing a first ground plane fit on subset D, each pixel producing residual value X, cumulatively known as residual set X; (f) analyzing residual X, including performing a residual density analysis and marking pixels whose residual value X exceeds specified threshold M to form an unmarked pixel subset of subset D, referred to as subset E; (g) performing a second ground plane fit on subset E, each pixel producing residual value Y, cumulatively known as residual set Y; (h) analyzing residual set Y, including marking pixels whose residual value Y exceeds specified threshold N to form an unmarked pixel subset of subset E, referred to as subset F; and (i) estimating the reference plane for subset F.