The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6714347 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 30, 2004

Filed:

Feb. 14, 2002
Applicant:
Inventors:

Juergen Pensel, Altstaetten, CH;

Ulrich Sander, Rebstein, CH;

Assignee:

Leica Microsystems AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/100 ; G02B 2/120 ;
U.S. Cl.
CPC ...
G02B 2/100 ; G02B 2/120 ;
Abstract

A microscope, which may be a stereomicroscope, includes: at least one objective; at least one eyepiece; at least one optical component configured to form a beam path from the objective to the eyepiece, where each optical component includes a lens, mirror, or deflection prism; and a tube configured to enclose a portion of the beam path, including at least one region of modifiable length configured to connect to at least one optical correction element and configured so that the optical correction element may be inserted into or removed from the portion of the beam path. The microscope may include a linkage between the tube and the correction lens configured to pivot or slide the correction lens as a function of a length of the region of modifiable length.


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