The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2004
Filed:
Jul. 03, 2002
Hiroshi Ota, Uji, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A method of obtaining a spectrum in a Fourier transformation infrared spectrophotometer includes the following steps: sampling a set of data while a movable mirror of the Fourier transformation infrared spectrophotometer performs a reciprocal movement, wherein the set of data constitutes an interferogram; judging whether the interferogram is reliable or not by comparing the shape of the interferogram with a shape of another interferogram or shapes of other interferograms obtained through neighboring measurement of measurements; accumulating the data of interferograms that are judged to be reliable; and constituting an absorption spectrum using a Fourier transformation method based on the accumulated data. Since unreliable data are adequately avoided from the data accumulation, the reliability of the accumulated data is assured, and an accurate absorption spectrum can be obtained. Thus, even when a mechanical disturbance or an electrical shock affects the measurement instantaneously, there is no need to repeat the measurement, and the absorption spectrum obtained after the measurement is still reliable. This is especially useful when the sample does not allow a second measurement.