The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2004
Filed:
Sep. 07, 2001
Applicant:
Inventors:
Yasushi Goto, Osaka, JP;
Yoshio Yuasa, Osaka, JP;
Assignee:
Minolta Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/42 ;
U.S. Cl.
CPC ...
G01J 1/42 ;
Abstract
An exposure meter has both function of an incident light type exposure meter for measuring an exposure value of an object by an incident light to the object and a reflected light type exposure meter for measuring exposure value of the object by a reflected light from the object. A latitude of a film is calculated from the exposure value by the incident light. The exposure value by the incident light and an upper and a lower limit values of the latitude are displayed on a display device. At least one exposure value measured by the reflected light is further displayed on the display device comparably with the latitude.