The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2004
Filed:
Feb. 07, 2002
Habib Vafi, Brookfield, WI (US);
Richard Gordon Cronce, New Berlin, WI (US);
Scott William Petrick, Sussex, WI (US);
Jeffrey Alan Kautzer, Pewaukee, WI (US);
David Conrad Neumann, Milwaukee, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
An X-ray imaging system that utilizes the leakage, or dark current, of a detector panel's photodiodes to provide more accurate data about the temperature and spatial distribution of temperature of the X-ray detector panel. Offset images are taken at known temperatures and recorded for each photodiode at two or more known temperatures. A temperature versus offset image value curve is the created for each photodiode. A second offset image value is determined immediately prior to or immediately after X-ray acquisition to determine the temperature of the detector panel at the time of X-ray acquisition. A coupled closed-loop cooling system utilizes the determined temperature to maintain the detector panel within a preferred temperature range.