The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2004
Filed:
Apr. 19, 2001
Applicant:
Inventors:
Assignee:
International Paper Company, Stamford, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D21F 7/06 ;
U.S. Cl.
CPC ...
D21F 7/06 ;
Abstract
A mathematical model is used to design paper and paperboard having improved runnability. The mathematical model provides an estimate of fracture toughness for an optimized paper product based on specific measurement parameters, e.g., filler percent, softwood content and caliper for optimal fracture toughness. After the optimizing set of measurement parameters has been acquired, these parameters can be used to manufacture grades of paper having improved runnability performance, e.g., in printing presses.
Hamad, Wadood. (2004). Method for manufacturing paper and paperboard using fracture toughness measurement (U.S. Patent No. 6712936). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6712936
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile