The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2004
Filed:
Apr. 10, 2002
Applicant:
Inventors:
James J. O'Brien, Quakertown, PA (US);
Edward R. Mourar, Glenmoore, PA (US);
Assignee:
Topcon American Corporation, Paramus, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 ;
U.S. Cl.
CPC ...
A61B 3/00 ;
Abstract
A support system for at least one of ophthalmic and optometric instruments. A first instrument supporting member is pivotable between a first storage position and a first use position. A second instrument supporting member is moveable between a second storage position and a second use position. The patient can be sequentially examined, in any order, by the first and second instruments while remaining in a test position.
O'Brien, James. (2004). System and method for measuring vision (U.S. Patent No. 6712470). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6712470
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile