The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2004

Filed:

Feb. 15, 2002
Applicant:
Inventors:

Joni Lehtinen, Kangasala, FI;

Tomi Vaara, Espoo, FI;

Assignee:

Nokia Corporation, Espoo, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/10 ;
U.S. Cl.
CPC ...
H04B 1/10 ;
Abstract

A method for smoothing measurement results is presented, in which a parameter is calculated, using weight factors, from a number of measurement results in a sample. The parameter is a measure of the center of the sample and has a breaking point different from zero. Using this method, neither an increased number of measurements nor the removal of outliers are required when the reliability of individual measurement results is questionable due to interference, such as momentary burst noise.


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