The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2004
Filed:
May. 31, 2002
Applicant:
Inventors:
Andrew Joseph Galish, West Chester, OH (US);
Thomas William Birdwell, Middletown, OH (US);
Ralph Gerald Isaacs, Cincinnati, OH (US);
Francis Howard Little, Cincinnati, OH (US);
Assignee:
General Electric Cormpany, Schenectady, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 1/02 ;
U.S. Cl.
CPC ...
G21K 1/02 ;
Abstract
An X-ray inspection system is provided having an X-ray source and first and second collimators. The first and second collimators are arranged in relation to the source and the target such that the portion of the target actually illuminated by The X-ray beam is substantially equal to the size of a selected inspection zone.