The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2004
Filed:
Nov. 30, 1999
James Wichelman, Fort Collins, CO (US);
Bruce Votipka, Fort Collins, CO (US);
Eric N. Flink, Loveland, CO (US);
Kathy Hertzog, Loveland, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Channel and test plans are implemented in connection with a plurality of nodes that communicate signals. The channel plan has one or more predefined specifications for each of one or more signal channels on each of the nodes. The channel plan enables a monitoring system to generate and conduct automatic periodic node test plans based upon the predefined specifications. Each test plan prescribes measurement of at least one node and/or channel signal parameter. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller. The controller is configured to enable creation of and display the channel plan and test plan, and to automate the node testing. The test plan may include alarm thresholds that are triggered and tracked when a signal parameter of a node or channel exceeds an alarm threshold.