The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2004
Filed:
Jan. 22, 2002
Applicant:
Inventors:
Michael Jacob, München, DE;
Thomas Röhr, Yokohama, JP;
Assignee:
Infineon Technologies AG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 1/122 ;
U.S. Cl.
CPC ...
G11C 1/122 ;
Abstract
A test circuit is integrated in a ferroelectric memory component in order to make analog measurements of bit line signals of ferroelectric memory cells. The test circuit, when in a test mode, reads out analog signal values for the respective memory content of the cells and feds the analog signal values to a downstream evaluation device. The test circuit is integrated as an analog circuit in the ferroelectric memory component and, in the test mode with non-activated or disconnected sense amplifiers, is configured to output analog bit line signals from the memory component to a point outside the memory component.