The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2004

Filed:

Sep. 27, 2001
Applicant:
Inventors:

Anton P. De Weijer, Nijmegen, NL;

Robert J. Van Wijk, Arnhem, NL;

Erik Swieringa, Nijmegen, NL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/44 ; G01B 1/100 ;
U.S. Cl.
CPC ...
G01J 3/44 ; G01B 1/100 ;
Abstract

The invention pertains to a process for determining the dye uptake of polyethylene terephthalate fibers in which the fibers are irradiated with high-intensity monochromatic light. A light-sensitive sensor is used to measure the Raman scattering and compare it with that of an earlier established model on the basis of Raman spectra of polyethylene terephthalate fibers of known composition and structure. A model is used to calculate the density, which constitutes a quantitative measure of the dye uptake. In the calculation use is made of measurement points from a number of regions in the spectral measuring region of 598 to 1900 cm .


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