The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2004

Filed:

Sep. 17, 2002
Applicant:
Inventors:

Jeffery Alan Fisk, Olney, MD (US);

Richard Eric Nordgren, Daleville, VA (US);

Assignee:

MeadWestvaco Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/116 ;
U.S. Cl.
CPC ...
G01B 1/116 ;
Abstract

This invention is directed to a method and apparatus for the measurement of web strain in a confined area. The apparatus comprises a fiber optic scope means and a fiber optic tube means operatively connected to the fiber optic scope means. The fiber optic scope means is secured inside the fiber optic tube means. An adjustable stand-off means is placed on the web. In an exemplary embodiment the stand-off means is operatively connected to the fiber optic tube means to provide a fixed but adjustable focal length between an end of the fiber optic scope means and the surface of the web. In an exemplary method, the web surface is marked with a series of reference points. The reference points are visually measured using the fiber optic scope means. After the web undergoes a movement, such as a converting step or fold, the web is again visually examined using the fiber optic scope means. The relative movement of the reference points is visually determined.


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