The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2004
Filed:
Dec. 28, 2000
Itaru Tamura, Tokyo, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A failure analyzing method using a failure-analyzing semiconductor device includes a first step of manufacturing a semiconductor device adapted for product in predetermined numbers during a first interval and a second step of manufacturing a failure-analyzing semiconductor device in predetermined numbers every second interval during the first interval. The first step includes a step of forming memory cells in a first semiconductor substrate. The second step includes a step of forming memory cells in a second semiconductor substrate and a step of forming first and second digitated interconnections at the same level above the second semiconductor substrate, which are connected to the memory cells and arranged so that the fingers of each of the first and second interconnections are interleaved with those of the other with a predetermined space therebetween.