The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2004

Filed:

Feb. 25, 2002
Applicant:
Inventors:

Kiyokazu Mori, Kanagawa-ken, JP;

Taishi Tarui, Kanagawa-ken, JP;

Shinsuke Takemura, Kanagawa-ken, JP;

Assignee:

Nissan Motor Co., Ltd., Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 2/600 ;
U.S. Cl.
CPC ...
B23K 2/600 ;
Abstract

Infrared reflection of a laser beam (LB ) irradiated on a welding part (WP) of work ( ) is detected by a sensor ( ) high of elevation angle, where it is converted into an electrical signal, which is processed by a measuring circuit (MC) to be input to a quality monitor (QM), where it is stored as a data in a memory ( ), which data is processed by way of a spectral analysis, which calculates a spectral distribution of electrical signal, and a signal power sum in a particular frequency band, to be compared with a threshold value for decision on occurrence of a significant porous state.


Find Patent Forward Citations

Mori, Kiyokazu. (2004). Laser weld quality monitoring method and system (U.S. Patent No. 6710283). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6710283

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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