The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2004
Filed:
Oct. 25, 2002
Michael Nordlund, Singapore, SG;
Manish Agarwal, Singapore, SG;
Hewlett-Packard Development Company, LP., Houston, TX (US);
Abstract
A method for measuring a pen-to-paper spacing in an inkjet printing mechanism is provided. Firstly, a first nozzle of a printhead in the printing mechanism ejects a first ink drop onto a medium at a first ejection velocity when the printhead moves at a first moving velocity along a scanning axis and when the printhead reaches a first position along the scanning axis. Subsequently, a second nozzle of the printhead ejects a second ink drop onto the medium at a second ejection velocity when the printhead moves at a second moving velocity along the scanning axis and when the printhead reaches a second position along the scanning axis. The spacing between the two nozzles along the scanning axis and the spacing between the two positions along the scanning axis are predetermined. Then the spacing between the first and second ink drops on the medium along the scanning axis is measured. The pen-to-paper spacing can be determined from the first and second moving velocities, the first and second ejection velocities, the spacing between the first and second nozzles along the scanning axis, the spacing between the first and second positions along the scanning axis and the spacing between the first and second ink drops on the medium along the scanning axis.